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Auto LCR Technique (FAI)
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Auto LCR Technique
It is possible to inspect L, C, R (can be inspected as a diode option) for various first products such as PCBA with double-sided tape application and dummy board, and also measure PCBA with soldered finished products.
Semiconductor Packaging Test
First Article Inspection
OSAT Industry
Probe Card Test
FPCB Test
NPI Test
Bio Sensor
Raw Material L,C, R Inspection
Any Industries or product that requires to test L, C, R, D
AUTO LCR TECHNIQUE (First Artical Inspection)
- Auto LCR Technique is focused on first article inspection of double side tape application board of measuring value of L,R,C,D and location.
- All process will run automatically therefore no human errors or measure in short time with extract accurate measurement value.
- Prevent from mix component; insert location and reel change prevention.
HIGHLIGHTS
- All inspections are performed automatically, and it is a device that can inspect devices of at least 0201/0603 size quickly and accurately without difficulty. In addition, if necessary, the user can directly measure and save data in real time through the LCR meter installed in the equipment, adding the convenience of manual inspection, enabling first-article inspection with more perfect results.
Auto Alignment
Library Available
Retry Test
Optimized Route
Fail Visualizer
Result with CSV and connect with MES
Speed Control
No Fixture or Jig Required
Program can generate within a 10 min
Optional for Diode Inspection is available
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Your Testing Solution is Here!
Explore the Emerix Board Test Application today. Designed for precision and efficiency, our application offers cutting-edge features that streamline your workflow and enhance testing accuracy.
